=> Perform a long press
approximately 30s.).
=> Perform another log press on the
Possible error messages :
Display - Indication
Hz
U
> 2V
xy
> 5Ω Ω Ω Ω Ω
3.4
RECORDING MEASUREMENT RESULTS ( MEM )
IMPORTANT - Each measurement stored is filed in the instrument according to two indexes: an object
number (OBJ) and a test number (TEST). A given object generally contains several tests (think of
directories/folders and files in computing).
For example: an OBJ no. can be used to locate an installation, and the TEST nos. identify the various
measurements made on this installation.
At any time, the user can store the result of a measurement and all of the parameters associated with
the measurement: date, time, type of measurement, measurement parameters, etc.
The location proposed by default is the first free memory location.
measurement
to be stored
03 06
OBJ TEST
FREE
stored
measurement
(1)
"FREE" : the selected memory location is free / "OCC" : the selected memory location is occupied.
(2)
whether the location chosen is occupied or not (previously recorded values overwritten)
Note : up to 100 measurements can be stored (for example : 20 objects of 5 tests each, or any other
combination of numbers of objects and of tests).
. Upon release, the compensation measurement is triggered (duration:
TEST
key to return to voltage measurement.
TEST
Remark - Possible cause
The instrument detects a voltage greater than 2V between
two of the terminals L, N, and/or PE : the compensation is
not applied. A long press on the
to voltage measurement mode.
The measurement is > 5Ω : the compensation is not taken
into account. A long press on the
to voltage measurement.
MEM
selection of storage address using the following :
and
(1)
MEM
51
key causes a return
TEST
key causes a return
TEST
storage at the
(2)
selected address