Warning!
Use the diode test to check diodes, transistors, and other semiconductor devices. The diode
test sends a current through the semicondutor junction, then measure the voltage drop across the
junction. A good silicon junction drops between 0.5V and 0.8V.
To test the diode out of a circuit, connect the Meter as follows:
1. Insert the red test lead into the VΩ terminal and the black test lead into the COM terminal.
2. Set the rotary switch to
3. Forward voltage drop readings on any semiconductor component, place the red test lead on
the component's anode and place the black test lead on the component's cathode.
The LCD displays the nearest value of diode forward voltage drop.
Note
- In a circuit, a good diode should still produce a forward voltage drop reading of 0.5V to 0.8V;
however, the reverse voltage drop reading can vary depending on the resistance of other pathways
between the probe tips.
- Connect the test leads to the proper terminals as said above to avoid error display. The LCD
will display "1" indicating open circuit for wrong connection. The unit of diode is Volt (V),
displaying the positive-connection voltage-drop value.
- When diode testing has been completed, disconnect the connection between the testing leads
and the circuit under test.
To test for continuity, connect the Meter as below:
1. Insert the red test lead into the VΩmA terminal and the black test lead into the COM terminal.
2. Set the rotary switch to
3. Connect the test leads across with the object being measured.
4. The buzzer sounds continuously if the resistance of a circuit under test is ≤ 100Ω, it indicates
the circuit is in good connection.
The buzzer does not sound if the resistance of a circuit under test is >70Ω it indicates broken
circuit.
The buzzer may or may not sound if the resistance of a circuit under test is between 10Ω to 70Ω.
The LCD displays the resistance value of a circuit under test.
Note
•
The LCD displays "1" indicating the circuit being tested is open.
•
When continuity testing has been completed, disconnect the connection between the testing
leads and the circuit under test.
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G. MEASURING DIODES & CONTINUITY
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