LEM SATURN 100 plus Instrucciones De Uso página 54

Information for the tester
Test current for measuring
the contact voltage: Typical 35% of I ∆N ; alternating
1 period on - 1 period off
max. 18 double periods.
Non-tripping test: Typical 35% of I ∆N – 500 msec long
Intrinsic error of test
Tripping test:
10 mA
30, 100 mA
300, 500 mA
1000 mA
Ramp
1) When I
= 1000mA: 15 increments from 35%...105% I
∆ N
When I = 10/30/100/300/500: 16 increments from 35%...110% I
∆ N
Contact Voltage
Resolution
Range(U L )
0,1 – 99,9 V 0,1 V
Internal resistance: approx. 470 kΩ
Measuring time (without tripping test):
2 - 26 cycles, dependent on U
U ≥ 50 V
L
-FI the fault voltage is referenced to two time of nominal rated residual
For S
current.
Remarks
current
Standard (1 x I
∆ N
selective S (2 x I
0 ... +7 %
0 ... +5%
5 x I ∆N ; and
1x or
0 ... +5 %
2 x S only with U >
153
1 x or
0 ... +5 %
only with U >153V
16 increments 1 ),
±10%
35% ... 110% of I
∆ N
∆ N
Intrinsic error
0...+15% of m.v.+ 2 digits
max. 200 ms at
L
52
)
)
∆ N
∆ N