Scan Measurement - X-Rite PANTONE i1 PRO 3 PLUS Manual De Uso

Scan Measurement

Virtual aperture technology
During a scan measurement the i1Pro 3 device is performing 400 measurements per
second. The automatic patch detection of the device identifies useable measurements
made on a patch and unusable measurements made between two patches. Valid
measurements on a patch are averaged and the device reports the averaged result
to the software. Thanks to this technology the virtual aperture of the i1Pro 3 device
adapts to the length of a patch. For best measurement results the length of the
patches on your test chart should be selected based on the resolution of your printer.
In some cases, increasing the width of the patches will yield more accurate results.
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Measurement conditions
The i1Pro 3 measurement device supports multiple measurement conditions. In a
single pass scan measurement, the patches are illuminated with the LEDs in the
i1Pro 3 device.
Single Pass Measurement is required for measurement condition
• ISO 13655 M0 | Tungsten filament lamp with UV included (NoFilter)
• ISO 13655 M1 | D50
• ISO 13655 M2 | Illumination with UV excluded (UVcut)
• ISO 13655 M3 | Polarization (UVcut)
• OBC | X-Rite Optical Brightener Compensation
The status indicator on the i1Pro 3 device guides you through the measurement
process.
M3 Polarization may be useful in reflection mode for measuring materials highly
reflective/glossy, non standard materials like textiles, ceramics, etc., and inks that are
not fully dry.
EN
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