Multicheck6010
Displayed results:
x1 (left)
x1 (right)
x5 (left)
x5 (right)
x½ (left)
x½ (right)
IΔ (+)
IΔ (-)
Uc
Note:
• the x1 Auto tests will be automatically skipped for RCD type B with rated residual
currents of IΔN = 1000 mA
• the x5 Auto tests will be automatically skipped in the following cases:
• RCD type AC with rated residual currents of IΔN = 1000 mA
• RCD type A and B with rated residual currents of IΔN >= 300 mA
• In these cases, the auto test result passes if the t1 to t4 results pass, and on the
display are omitted t5 and t6.
4.3.5 Warnings
• Leakage currents in the circuit following the residual current device (RCD) may influence the
measurements.
• Special conditions in residual current devices (RCD) of a particular design, for example of type S
(selective and resistant to impulse currents) shall be taken into consideration.
• Equipment in the circuit following the residual current device (RCD) may cause a considerable
extension of the operating time. Examples of such equipment might be connected capacitors or
running motors.
Step 1 trip-out time result, t3 (I
Step 2 trip-out time result, t4 (I
Step 3 trip-out time result, t5 (5x IΔN, 00),
Step 4 trip-out time result, t6 (5x IΔN, 1800),
Step 5 trip-out time result, t1 (½xI
Step 6 trip-out time result, t2 (½xI
Step 7 trip-out current ((+) positive polarity)
Step 8 trip-out current ((-) negative polarity)
Contact voltage for rated IΔN.
, 0º),
ΔN
, 180º),
ΔN
, 00),
ΔN
, 1800),
ΔN
- 74 -
EN